Detecting Bridging Faults with Stuck-at Test Sets

Simulations run on sample circuits show that extremely high detection of bridging faults is possible using modifications of psuedo-exhaustive test sets. Real chips often contain bridging faults, and this research shows that stuck-at test sets are not sufficient for detecting such faults. The modified pseudo-exhaustive test sets are easy to generate and require little, or no, fault simulation. r Criteria have been found for identifying bridging faults unlikely to be detected by test sets. r , Techniques for increasing the bridging fault coverage of test sets without consuming excessive computer time are suggested.